Publications by Luk, Stella
In Conference (refereed)
1. | O. Zaiane, M. El-Hajj, Y. Li, S. Luk. "Scrutinizing Frequent Pattern Discovery Performance". IEEE International Conference on Data Engineering (ICDE), Tokyo, Japan, pp 1109-1110, April 2005. |
1. | O. Zaiane, M. El-Hajj, Y. Li, S. Luk. "Scrutinizing Frequent Pattern Discovery Performance". IEEE International Conference on Data Engineering (ICDE), Tokyo, Japan, pp 1109-1110, April 2005. |